FORM), a supplier of electrical test and measurement technologies, has introduced the EVOLVITY™ 300, a semi-automated engineering wafer probe system that complements the company’s proven CM300 ...

Fig. 3: Correlation of whole wafer inspection images to wafer test maps. Source: Microtronic Meanwhile, wafer handling issues during wafer probe test can affect multiple die. Consider foreign material ...

Gayn Erickson; President, Chief Executive Officer, Director; Aehr Test Systems Chris Siu; Chief Financial Officer, Executive Vice President - Finance, Secretary; Aehr Test Systems Greetings. Welcome ...

We're setting up the test cell and new wafer packs with a high density fine pitch probe head during the upcoming month. This is very exciting as we believe Aehr has the ability to successfully ...

LIVERMORE, Calif., April 08, 2025 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), a supplier of electrical test and measurement technologies, has introduced the EVOLVITY™ 300, a semi-automated ...

Teradyne has partnered with ficonTEC to launch an innovative high-volume, double-sided wafer probe test cell for silicon photonics, marking a significant development in electro-optical testing for ...

docking and wafer probe equipment solutions. About InTest Corporation and InTest EMS InTest Corporation is a global supplier of innovative test and process technology solutions for use in ...

It offers turnkey packaging and test services, including semiconductor wafer bump, wafer probe, wafer back-grind, package design, packaging, system-level and final test, and drop shipment services ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test ... Parallel testing is now the norm — from full wafer probe DRAM ...