Abstract: We evaluated and analyzed power silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) with gate switching mode during neutron irradiation with our commercial ...
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Abstract: Threshold voltage hysteresis in transistor characteristics is common for CMOS device reliability. Scaling impacts electrostatic performance, prompting reliability analysis. A key check ...
Florida property tax to be eliminated for seniors under new proposal Trump's granddaughter Kai downplays unusual nature of golfing with the president: 'It's nothing new' Indiana University fires ...