Abstract: The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network ...
Who What Wear on MSN
Some Say Jean Jackets Are Out, But These Cool Outfits Prove That Wrong
No matter the season or the reigning trends, there is one tried-and-true outerwear staple: the jean jacket. The classic denim ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback