A scan flip-flop internally has a mux at its input. SE (enable signal for mux) determines whether D (functional input) or SI (test input) will reach to the output of the flip-flop when active clock ...

This paper proposes a novel Test-Case methodology for System on chip (SoC) Verification in order to achieve high levels of reusability. It surveys the challenges of a traditional SoC Test-Case ...

Snapdragon 8s Gen 3 vs 7 Gen 3 — take a look at the benchmark scores to find out which chip delivers superior performance.

A new paper from Microsoft Research and Salesforce finds that even the most capable Large Language Models (LLMs) fall apart ...