WiMi Developed Digital Holography-Based Semiconductor Wafer Defect Detection Technology Aug. 31, 2023 8:00 AM ET WiMi Hologram Cloud Inc. (WIMI) ...

Defect traceability enhancements enabling root cause identification for more than 95% of module-level failures. These successes underscore the importance of incorporating AI and data-driven approaches ...

More information: Chen Tang et al, Wafer surface defect detection with enhanced YOLOv7, International Journal of Information and Communication Technology (2024). DOI: 10.1504/IJICT.2024.141433 ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. Abstract “Deep learning-based ...

More information: Jin-Woo Jung et al., Defect Passivation of 2D Semiconductors by Fixating Chemisorbed Oxygen Molecules via h-BN Encapsulations, Advanced Science (2024). DOI: 10.1002/advs.202310197 ...

Formation of defect-pairs in GaN under high-energy particle irradiation. Courtesy: S Chen Gallium nitride (GaN) is the world’s second-favourite semiconductor, present in devices ranging from ...

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of ...

This affects the crystals in subtle ways that will influence their activity in a range of applications. “Our work provides a new insight into the defect-related phenomena in 2D TMDs, that can trigger ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...