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A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

This breakthrough sets a new benchmark in global ocean modeling and defies ongoing semiconductor export ... the simulator acts like an ocean “microscope.” It can track detailed processes ...

Abstract: Surface defects on 4H-SiC wafers with an epitaxial layer grown by chemical vapor deposition (CVD) were observed using scanning electron microscopy (SEM). Commercially available ...

One of the most remarkable innovations in semiconductor manufacturing is the development of AI-powered defect detection systems. Advanced deep learning models are now being used to classify defects ...

Chemical quality matters in semiconductor manufacturing, so much so that a defective concentration can ruin an entire batch of components. Negative changes in liquid composition can occur at ...

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The simulation also evaluates point defects, including vacancy and interstitial defects. The formation of these defects at the crystal-melt interface and their recombination after solidification, ...