X-ray and neutron reflectivity were employed to elucidate the morphologies of bis[trimethoxysilylpropyl]amine silane (A) and vinyltriacetoxysilane (V) mixed films on Si wafers at different A/V ratios, ...

This paper presents the design, fabrication, and characterization of a microhelium dielectric barrier discharge photoionization detector (μHDBD-PID) on chip with dimensions of only ∼15 mm × ∼10 mm × ...