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Allowing �0.00025″ for planarity tolerance and assuming 0.0005″ for probe card deflection, the maximum OT could be only 0.00175″ for some probes, resulting in 2.45g and, as a result, a ...
Jenoptik has now developed a component that enables novel PIC wafer level tests with the opto-electronic UFO Probe Card. Semiconductor consultancy and contractor RoodMicrotec says it is benefiting ...
Allowing 0.00025″ for planarity tolerance and assuming 0.0005″ for probe card deflection, the maximum OT could be only 0.00175″ for some probes, resulting in 2.45g and, as a result, a high ...
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