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Parametric Method in Value at Risk (VaR): Definition and ExamplesThe parametric approach to VaR uses mean-variance analysis to predict future outcomes based on past experience. The parametric VaR calculation is straightforward but makes the assumption that ...
The digitization of production and technological resources linked to the development of increasingly sophisticated tools has a direct impact on the contemporary practice of architecture and urbanism.
Keithley Instruments, Inc. has introduced seven instrumentation, software, and test fixture configurations for parametric curve tracing applications for characterizing high power devices at up to ...
Typically specialized for either mechanical design or building design, a parametric modeler is aware of the characteristics of components and the interactions between them. It maintains consistent ...
We demonstrate that employing parametric amplification in the frequency ... unlike in OPCPA where the temporal gain curve can narrow the temporally chirped seed spectrum. We will briefly outline ...
The curve tracer is ideally suited to DC parametric testing of devices such as discrete semiconductors, analogue ICs, MOS logic and other digital ICs, LEDs and other optical devices, and solar battery ...
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