If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process itself did not compromise wafer quality. But damage to a particular die on a wafer can ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

The introduction of the double-sided wafer probe test cell is expected to have a significant impact on the silicon photonics and CPO market. By enabling high-throughput electro-optical testing of ...

Teradyne Inc. today announced Hynix Semiconductor Inc. has evaluated high-speed wafer test at its facility in Ichon, South Korea, using a Teradyne wafer probe system. Boston-based Teradyne (nyse: TER) ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30, 2022 /EINPresswire.com ...