Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive, said Microtronic CEO Rein ...

"Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive," said Microtronic CEO Reiner Fenske in making the announcement.

Fraunhofer develops "resource-efficient" measurement system for semiconductor wafer production Jul. 17, 2025 – The Fraunhofer Institute for Photonic Microsystems (IPMS), in collaboration with DIVE ...

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SK hynix to reportedly change wafer cutting for its next-gen HBM4 memory and 400-layer NAND flash, as they're becoming increasingly thin.

HANMI Semiconductor plans to combine TES's plasma, thin film deposition, and cleaning technologies with bonding technology for high-bandwidth memory (HBM).

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China's semiconductor dreams stumble as another fab collapses Staff reporter, Taipei; Levi Li, DIGITIMES Asia Tuesday 8 July 2025 0 Credit: Jiangsu Advanced Memory Semiconductor Co., Ltd.

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...