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WiMi Developed Digital Holography-Based Semiconductor Wafer Defect Detection Technology Aug. 31, 2023 8:00 AM ET WiMi Hologram Cloud Inc. (WIMI) ...
More information: Jin-Woo Jung et al., Defect Passivation of 2D Semiconductors by Fixating Chemisorbed Oxygen Molecules via h-BN Encapsulations, Advanced Science (2024). DOI: 10.1002/advs.202310197 ...
HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of ...
Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...
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Solving long-standing challenge in semiconductor manufacturing—a ...More information: Chen Tang et al, Wafer surface defect detection with enhanced YOLOv7, International Journal of Information and Communication Technology (2024). DOI: 10.1504/IJICT.2024.141433 ...
The company's industry-leading macro defect inspection system, EAGLEview, is distinguished by unprecedented speed, which enables it to automatically macro-inspect 100% of every wafer in every lot ...
Defect traceability enhancements enabling root cause identification for more than 95% of module-level failures. These successes underscore the importance of incorporating AI and data-driven approaches ...
Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...
This affects the crystals in subtle ways that will influence their activity in a range of applications. “Our work provides a new insight into the defect-related phenomena in 2D TMDs, that can trigger ...
Formation of defect-pairs in GaN under high-energy particle irradiation. Courtesy: S Chen Gallium nitride (GaN) is the world’s second-favourite semiconductor, present in devices ranging from ...
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