I built a 3D printed, scanning laser confocal microscope so I could collect 3D surface topology and profilometry data! The microscope stage is based on an OpenFlexure "Delta" stage, and the ...

In October 2024, the company launched the ZEISS Crossbeam 550 Samplefab, an automated focused ion beam scanning electron microscope companies have designed for efficient sample preparation in ...

Abstract: The continuous miniaturization of semiconductor patterns improves performance but also leads to frequent pattern disruptions that significantly reduce manufacturing yields. In the field, ...

ZEISS announces the new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM ... imaging provides essential information for understanding semiconductor device ...

Comparison between conventional imaging using an imaging system (left) and “diffractive imaging” (right). Our EUV diffractive imaging experiment setup. A photo of the high-harmonic generation ...

Michigan State University combined terahertz laser light, shown as a red wavy arrow, with a scanning tunneling microscope ... lasers to detect semiconductor “defects” like never before.

1 Scanning electron microscope (SEM) allows analysis of a semiconductor surface and cross-section with high resolution, revealing contamination, cracking, or thermal damage. Additionally, electrical ...

A scanning electron microscope view of the crystallites ... anneal copper indium sulfide (CuInS2) semiconductor crystals in space in an effort to reduce defects that commonly occur in crystal ...