Going out to eat? See which Duval County restaurants were rated best by inspectors, and which failed the test.

technique is proposed based on weighted pseudorandom test pattern generation and reseeding. A new LP scan architecture is proposed, which supports both pseudorandom testing and deterministic BIST.

Abstract: A new approach for structural, fault-oriented analog test generation methodology to test for the presence of manufacturing-related defects is proposed. The output of the test generator ...