Abstract: Machine unlearning in the domain of large language models (LLMs) has attracted great attention recently, which aims to effectively eliminate undesirable behaviors from LLMs without full ...
Abstract: In high-power applications, power modules with multi-paralleled chips have been widely used. The reliability of power electronic devices is intimately tied to thermal characteristics, making ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback