Abstract: Many existing soft-error-tolerant flip-flop designs (e.g., MDAD-FF, SETU-TOFF, SEDR-FF) apply delayed latching to mitigate strikes of radiation particles. However, according to AEC-Q100 ...
Abstract: A simple simulation-based approach to accurately estimating the single even effect (SEE) cross section of a standard cell library Flip-Flop is presented. A SPICE level model of charge ...
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