Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, ...
Breakthrough yield and device performance at high volume show team can scale company’s large-format advanced packaging for customers’ cutting-edge applications SINGAPORE, SG / ACCESS Newswire / ...
Korea JoongAng Daily on MSN
Samsung’s Exynos to return in Galaxy S26, but still falls short of Snapdragon in test
The long-anticipated comeback of Samsung Electronics’ Exynos mobile processor, likely to power the upcoming Galaxy S26 series, will be a significant test of the company's chipmaking capabilities and a ...
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