Wafer metrology tools are used to design and manufacture ICs by carefully controlling the film properties, linewidths, and potential defect levels in order to optimize the manufacturing process of ...

Wafer bowing causes measurement errors as the wafer is scanned. A unique custom self-calibration tool and algorithm finds very small angular errors in the cameras and the machine uses this information ...

The brief was that the wafer probe yield was disastrous and the correlation wafer was not giving the correct results. Getting to the punch line is going to require some IC fabrication background ...

The brief was that the wafer probe yield was disastrous and the correlation ... So let’s talk about the tools of the trade. Automated Test Equipment (ATE) is a bit of broad term, but we ...

Report on how AI is driving market transformation - The global probe card market size is estimated to grow by USD 1.73 ...