The idea is you bolt the wafer probe card into the top of the machine, needles-down, then wheel the whole thing over to the ATE. The ATE head will have that pogo-tower already docked.

Standard MCUs range in site counts, often higher in wafer probe (up to x64) and from ~16 to 128 for package test (and up to x320 strip test in a recent example). This is a high-mix market, so the ROI ...

“Our customers’ wafer probe cards are growing in their usage of multi-site test,” said Keith Schaub, vice president of technology and strategy at Advantest America. “Combine this with an increase in ...

LIVERMORE, Calif., April 08, 2025 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), a supplier of electrical test and measurement technologies, has introduced the EVOLVITY™ 300, a semi ...