The idea is you bolt the wafer probe card into the top of the machine, needles-down, then wheel the whole thing over to the ATE. The ATE head will have that pogo-tower already docked.

“Our customers’ wafer probe cards are growing in their usage of multi-site test,” said Keith Schaub, vice president of technology and strategy at Advantest America. “Combine this with an increase in ...

Standard MCUs range in site counts, often higher in wafer probe (up to x64) and from ~16 to 128 for package test (and up to x320 strip test in a recent example). This is a high-mix market, so the ROI ...

LIVERMORE, Calif., April 08, 2025 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), a supplier of electrical test and measurement technologies, has introduced the EVOLVITY™ 300, a semi ...