Harmony eXP, a full-wafer-contact probe card from FormFactor, can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30, 2022 /EINPresswire.com ...

Technavio analysts forecast the global probe card market to register at a CAGR of almost 5% during 2018-2022, according to their report.

The new SmartMatrix 3000XP probe card allows DRAM manufacturers to test 3000 die or more in a single touchdown leveraging FormFactor’s proprietary Tester Resource Enhancement (ATRE) and MEMS ...

SV Probe recently announced two new probe cards for semiconductor wafer test. Targeting NAND flash memory, the SureTouch single-touchdown memory probe card enables testing of all devices on a wafer ...

FormFactor FORM is leaving no stone unturned to expand semiconductor wafer probe card production. This is evident from the recent opening of the company’s new probe card manufacturing facility ...

As a “plug and play” solution, the hybrid probe card can be integrated directly and without much of an adaption effort into RoodMicrotec’s existing standard IC wafer probers. The existing ...

The technology is based on a concept for optical probing of photonic integrated circuits, which is insensitive to alignment tolerances in the wafer prober. As consequence, the opto-electronic probe ...

11,000-Probe Card Tests 300-mm DRAMs In Only Six Touchdowns Nov. 11, 2002 Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm ...

Co announces that Hynix Semiconductor has placed a multi-million-dollar order for FORM's Harmony OneTouch probe cards for Flash memory production. The probe cards, which will be shipped to Hynix ...