At his keynote titled “Silicon Carbide Mass Commercialization and Future Trends” at APEC 2023, Victor Veliadis, executive director and CTO at Power America, outlined wafer cost, defects, scalability ...

is delighted to share its advances in wafer edge profiling for silicon carbide (SiC) wafers. The LCS 305 5-axis system offers excellent profiling results, eliminates chipping, and increases ...

today announced that a new customer has selected its FOX-PTM test and burn-in system to be used for qualification and production wafer level test and burn-in of their silicon carbide devices for ...