By varying crystal growth and processing conditions, the effects of crystalline defects and impurities at surfaces, interfaces and in the bulk semiconductor can be investigated and often enhanced or ...

Chinese researchers have discovered the leading cause of defects in the promising semiconductor material gallium nitride (GaN). This material is critical for developing advanced electronics ...

A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...

More information: Volodymyr Shamraienko et al, Weak Spots in Semiconductor Nanoplatelets: From Isolated Defects Toward Directed Nanoscale Assemblies, Small (2024). DOI: 10.1002/smll.202411112 ...

Topological materials are revolutionizing semiconductor manufacturing, offering enhanced conductivity and efficiency for next ...

Defects can occur in every step of the chip ... has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing.

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting ...

Notably, the two elements, "AI" and "Semiconductors" are advancing in tandem, with AI automating semiconductor manufacturing, predicting and detecting product defects, and improving production quality ...

The Semiconductor Defect Spectroscopy Laboratory at SFU housed instruments to investigate the electronic and structural properties of semiconductor defects. These complementary measurement methods ...