--WiMi Hologram Cloud Inc., a leading global Hologram Augmented Reality Technology provider, today announced that an innovative detection technique based on digital holography has been developed ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...