Although RF-wafer probes first emerged many years ago ... Also, it is important to minimize parasitic coupling at the probe tip, which can cause inaccuracy. Precision RF probes are essential for ...

Shrinking process geometries, increasing demands for RF parametric testing, and the need to probe a range ... across the entire wafer while maintaining simultaneous tip contacts during each ...

Agilent Technologies has introduced a 12-GHz differential wafer-probe tip that allows R&D and test engineers to use an oscilloscope to debug and test high-speed active ICs. The N2884A InfiniiMax ...

Many KGDs are used in RF multichip assemblies (MCAs), which implies the need for wafer-level performance testing of RF parts. Another trend contributing to functional test at wafer probe is the ...

“The least-understood impact of wafer probe is interaction between the wafer probe tip’s physical impact on active circuits below the pad/bump and upstream packaging processes,” said George Harris, ...

He thus built a FET input probe for higher RF frequencies, and its construction is an accessible view of wideband RF instrumentation design. The circuit is a very simple one using a dual-gate FET ...

The EVOLVITY 300 simplifies on-wafer probing with its compact ... between applications such as advanced RF measurements, DC characterization, and probe cards. Additionally, the system offers ...