Agilent Technologies has introduced a 12-GHz differential wafer-probe tip that allows R&D and test engineers to use an oscilloscope to debug and test high-speed active ICs. The N2884A InfiniiMax ...

Multi IZI Probe, a new RF wafer prober from Suss MicroTec, offers up to eight independent RF transmission lines with 50-ohm impedance. The probe can be individually configured with RF and DC contacts ...

The EVOLVITY 300 simplifies on-wafer probing with its compact ... between applications such as advanced RF measurements, DC characterization, and probe cards. Additionally, the system offers ...

Many KGDs are used in RF multichip assemblies (MCAs), which implies the need for wafer-level performance testing of RF parts. Another trend contributing to functional test at wafer probe is the ...

Shrinking process geometries, increasing demands for RF parametric testing, and the need to probe a range ... across the entire wafer while maintaining simultaneous tip contacts during each ...

He thus built a FET input probe for higher RF frequencies, and its construction is an accessible view of wideband RF instrumentation design. The circuit is a very simple one using a dual-gate FET ...

“The least-understood impact of wafer probe is interaction between the wafer probe tip’s physical impact on active circuits below the pad/bump and upstream packaging processes,” said George Harris, ...

HSINCHU, Taiwan, Nov. 14, 2018 /PRNewswire/ -- MPI Corporation introduces a new 300 mm fully-automatic TS3500 wafer probe systems series ... accurate IV-CV, 1/f, RF, mmW, and Load-Pull measurements.