Early detection and analysis of process excursions decreases wafer scraps, prevents yield loss, and saves engineering and manufacturing resources. May 9th, 2023 - By: Krista Tropper Process excursion, ...

References [1] Fuzzy process capability analyses with fuzzy normal distribution. Expert Systems with Applications (2010). [2] Process Capability Analysis Using Interval Type-2 Fuzzy Sets ...

One study has developed confidence intervals for a process yield index by jointly considering two unilateral Six Sigma quality indices, thereby offering manufacturers a powerful tool for assessing ...

The Metron3D provides three-dimensional (3D) process control with sub-nanometre accuracy, crucial for fabrication of SK hynix ...

Although they are closely related, yield management and process control are not the same. Yield management seeks to maximize the number of functioning devices at the end of the line. Process control ...