Allowing �0.00025″ for planarity tolerance and assuming 0.0005″ for probe card deflection, the maximum OT could be only 0.00175″ for some probes, resulting in 2.45g and, as a result, a ...

Jenoptik has now developed a component that enables novel PIC wafer level tests with the opto-electronic UFO Probe Card. Semiconductor consultancy and contractor RoodMicrotec says it is benefiting ...

HSINCHU, March 18, 2025 /PRNewswire/ -- STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of ...

Allowing 0.00025″ for planarity tolerance and assuming 0.0005″ for probe card deflection, the maximum OT could be only 0.00175″ for some probes, resulting in 2.45g and, as a result, a high ...