The tables come in eight standard models with table diameters ranging from 12 to 200 in., and open centers ranging from 1 to 97 in. in diameter.

This “inspection-plan” approach only takes the designer a little additional time but lets vision system programmers complete their work up to 70% faster.

Semiconductor Manufacturing & Design sat down to discuss future metrology and inspection challenges with John Allgair, senior member of the technical staff at GlobalFoundries; Kevin Heidrich, vice ...

Using Table 1, the sample size code letter corresponding to General Inspection Level II and Lot Size range of 501 to 1,200 (for lot size of 1,000 as stated) is “J.” ...

Daifuku Airport Technologies (ATec) announced, a new Mobile Inspection Table (MIT) system has gone live at Cleveland Hopkins International Airport.

Tamar Technology designs and manufactures application-specific automated visual inspection and metro-logy systems for the semiconductor, micro-electromechnical systems (MEMS), data storage, micro ...

System Requirements and Justification Table 1, in the July 2001 issue of Evaluation Engineering, shows the types of inspection and their respective X-ray system requirements.