Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Many noise sources can plague high-speed radio-frequency (RF) analog signal chains, making design considerations that much more challenging. Both megahertz and sub-terahertz sampling-rate converters ...